Hot carrier effects in polycrystalline silicon thin-film transistors: Analysis of electrical characteristics and noise performance modifications

Microelectronics Reliability

Volumn 39, Issue 1, 1999, Pages 45-52

  Mariucci, L ^a   Pecora, A ^a   Giovannini, S ^a   Carluccio, R ^a   Massussi, F ^a   Fortunato, G ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; EXCIMER LASERS; HOT CARRIERS; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON;

SOLID PHASE CRYSTALLIZATION (SPC);

THIN FILM TRANSISTORS;

EID: 0032629884     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00162-0     Document Type: Article

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