β-Si3N4 whiskers embedded in oxynitride glasses: Interfacial microstructure

Journal of the American Ceramic Society

Volumn 79, Issue 10, 1996, Pages 2626-2632

  Sun, Ellen Y ^a,b   Alexander, Kathleen B ^a,b   Becher, Paul F ^a,b   Hwang, Shyh Lung ^a,c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c Kaohsiung Polytechnic Institute Taiwan   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; CRYSTAL WHISKERS; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; GLASS; INTERFACES (MATERIALS); INTERFACIAL ENERGY; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY (AEM); DEBONDING ENERGY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HREM);

SILICON NITRIDE;

EID: 0030262316     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb09025.x     Document Type: Article

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