Evidence for continuous areas of crystalline β-C3N4 in sputter-deposited thin films

Journal of Materials Research

Volumn 14, Issue 6, 1999, Pages 2359-2363

  Chowdhury, A K M S ^a   Cameron, D C ^b   Hashmi, M S J ^b   Gregg, J M ^c  

^a Ohio State University   (United States)

^b DUBLIN CITY UNIVERSITY   (Ireland)

^c QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; HYDROGEN; NANOSTRUCTURED MATERIALS; NITRIDES; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION;

CARBON NITRIDE; PENNING TYPE;

THIN FILMS;

EID: 0032628572     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0314     Document Type: Article

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