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Volumn 74, Issue 12, 1999, Pages 1719-1721

An ion-beam technique for measuring surface diffusion coefficients

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CURRENT MEASUREMENT; GALLIUM; ION BEAMS; ION BOMBARDMENT; MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT; MOLECULAR BEAM EPITAXY; REFLECTION; SCATTERING; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032622111     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123666     Document Type: Article
Times cited : (18)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.