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Volumn 74, Issue 12, 1999, Pages 1719-1721
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An ion-beam technique for measuring surface diffusion coefficients
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Author keywords
[No Author keywords available]
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Indexed keywords
DEPOSITION;
ELECTRIC CURRENT MEASUREMENT;
GALLIUM;
ION BEAMS;
ION BOMBARDMENT;
MATHEMATICAL MODELS;
MECHANICAL VARIABLES MEASUREMENT;
MOLECULAR BEAM EPITAXY;
REFLECTION;
SCATTERING;
SEMICONDUCTING GALLIUM ARSENIDE;
ADATOMS;
SPECULAR ION CURRENT MEASUREMENTS;
DIFFUSION IN SOLIDS;
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EID: 0032622111
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.123666 Document Type: Article |
Times cited : (18)
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References (20)
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