Spectroscopic signature of strong dielectronic recombination in highly ionized xenon produced by irradiating a gas puff with laser

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 59, Issue 1, 1999, Pages 188-194

  Doron, R ^a   Behar, E ^a   Mandelbaum, P ^a   Schwob, J L ^a   Fiedorowicz, H ^b   Bartnik, A ^b   Jarocki, R ^b   Szczurek, M ^b   Wilhein, T ^c  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^c UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; IRRADIATION; LASER PULSES; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; MOLECULAR SPECTROSCOPY; PLASMAS; TEMPERATURE; XENON;

DIELECTRONIC CAPTURE PROCESS; DIFFRACTIVE SPECTROGRAPH; ELECTRON TEMPERATURE; GAS PUFF TARGET;

ELECTRONIC STRUCTURE;

EID: 0032620319     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.59.188     Document Type: Article

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