Nanoscale observation of enhanced electromagnetic field

Physica Status Solidi (A) Applied Research

Volumn 175, Issue 1, 1999, Pages 337-343

  Gresillon S ^a   Rivoal, J Cl ^a   Gadenne, P ^b   Quelin X ^b   Shalaev, V ^c   Sarychev, A ^d  

^a CNRS   (France)

^b LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT   (France)

^c NEW MEXICO STATE UNIVERSITY   (United States)

^d RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; GOLD; IMAGE ANALYSIS; IMAGE QUALITY; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; PHASE TRANSITIONS; RAMAN SCATTERING; SURFACE ROUGHNESS; THIN FILMS;

NANOSCALE OBSERVATIONS; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

METALLIC FILMS;

EID: 0032594856     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199909)175:1<337::AID-PSSA337>3.0.CO;2-E     Document Type: Article

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