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Volumn 38, Issue 6 B, 1999, Pages 3845-3848

Barrier-height imaging of oxygen-adsorbed Si(001)2×1 and Ge(001)2×1 surfaces

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; GAS ADSORPTION; OXIDATION; OXYGEN; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON;

BARRIER HEIGHT IMAGING;

SCANNING TUNNELING MICROSCOPY;

EID: 0032594521 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.38.3845 Document Type: Article

Times cited : (7)

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