Structural and electronic properties of laser crystallized silicon films

Materials Research Society Symposium - Proceedings

Volumn 536, Issue , 1999, Pages 427-438

  Sameshima, T ^a  

^a Tokyo A and T University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC PROPERTIES; EXCIMER LASERS; GRAIN BOUNDARIES; HALL EFFECT; LIGHT ABSORPTION; PULSED LASER APPLICATIONS; SEMICONDUCTING SILICON;

HALL EFFECT MEASUREMENT; SILICON FILMS; THRESHOLD ENERGY DENSITY;

SEMICONDUCTING FILMS;

EID: 0032591542     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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