Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques

Microscopy Research and Technique

Volumn 42, Issue 2, 1998, Pages 108-122

  Oleshko, Vladimir P ^a   Gijbels, Renaat H ^a   Van Daele, Andre J ^a   Jacob, Wim A ^a   Xu, Yong En ^b   Wang, Su E ^b   Park, In Yeong ^c   Kang, Tai Sung ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c Korea Research Institute of Chemical Technology   (South Korea)

Author keywords

Cryo AEM; Crystal thickness; Excitons; Multistructured tabular Ag(Br,I) microcrystals; Stacking faults

Indexed keywords

CHLORINE COMPOUNDS; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRONS; ELECTROSTATIC DEVICES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROCRYSTALS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; STACKING FAULTS;

CRYO-AEM; CRYSTAL THICKNESS; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ENERGY DISPERSIVE X-RAY TECHNIQUE; ENERGY-DISPERSIVE X-RAYS; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; IMAGINARY PARTS; LOW-LOSS; MULTISTRUCTURED TABULAR AG(BR,I) MICROCRYSTAL; SILVER HALIDE MICROCRYSTALS;

EXCITONS;

HALIDE; SILVER;

ARTICLE; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; IMAGING SYSTEM; MICROSCOPY; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0032528564     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980715)42:2<108::AID-JEMT5>3.0.CO;2-P     Document Type: Article

References (57)

1. Ahn, C.C., and Krivanek, O.L. (1983) EELS Atlas. Center of Solid State Science, Arizona State University, Tempe, AZ; Gatan Inc., Warrendale, PA.
2. Baetzold, R.C., and Berry, C.R. (1977) Structural defects and ionic conductivity. In: The Theory of the Photographic Process. T.H. James, ed. Macmillan, New York, pp. 12-25.
3. Bakenfelder, I., Fromm, L., Reimer, L., and Rennekamp, R. (1990) III. Bragg contrast of crystalline specimens. J. Microsc., 159:161-177.
4. Bassani, F, Knox, R.S., and Fowler, W.B. (1965) Band structure and electronic properties of AgCl and AgBr. Phys. Rev., A4:1217-1225.
5. Carrera, N.J., and Brown, F.C. (1971) Optical response of AgCl and AgBr in the near extreme ultraviolet. Phys. Rev. B4: 3651-3660.
6. Czaja, W., and Baldereschi, A. (1979) The isoelectronic trap iodine in AgBr. J. Phys. C., 12:405-24.
7. Daniels. J., von Ferstenberg, C., and Raether, H. (1970) Optical constants of solids by electron spectroscopy. In: Springer Tracts in Modern Physics, Vol. 54. G. Hohler, ed. Springer-Verlag, Berlin, pp.77-135.
8. De Ridder, R., Van Tendeloo, G., Van Dyck, D., and Amelinckx, S. (1976) A cluster model for the transition state and its study by means of electron diffraction. Phys. Stat. Sol. (a), 38:663-674.
9. De Ridder. R., Van Dyck, D. Van Tendeloo, G., and Amelinckx, S. (1977) A cluster model for the transition state and its study by means of electron diffraction. II. Application to some particular systems. Phys. Stat. Sol. (a), 40: 669-683.
10. Doniach, S., and Sommers, C. (1985) Coherence of inelastically scattered fast electrons in crystals of finite thickness. Phil. Mag., A51:419-27.
11. Duval, P.H., and Henry, L. (1977) Calcul de l'influence de la diffusion inelastique des electrons sur les images de monocristaux. Phil. Mag., 35:1381-1385.
12. Egerton, R.F. (1989) Quantitative analysis of energy-loss spectra. Ultramicroscopy, 28: 215-225
13. Egerton, R.F. (1996) Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd ed. Plenum Press, New York, pp.1, 113, 131, 245, 407, 433.
14. Egerton, R.F., and Wang, Z.L. (1990) Plural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting aperture. Ultramicroscopy, 32:137-148.
15. Freedhoff, M.I., Marchetti, A.P., and McLendon, G.L. (1996) Optical properties of nanocrystalline silver halides. J. Lumin., 70: 400-413.
16. Gao,X.-L., Gijbels, R., Nys, B., Jacob, W., and Gilliams, Y. (1989) Anew and convenient method for the analysis of the halide distribution in tabular photographic silver halide microcrystals by backscattered electron imaging. J. Imag. Sci., 33:87-91.
17. Goessens, C., Schryvers, D., Van Landuyt, J., Amelinckx, S., Verbeeck, A., and De Keyzer, R. (1991) Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry. J. Cryst. Growth, 110:930-941.
18. Goessens, C., Schryvers, D., Van Dyck, D., Van Landuyt, J., and De Keyzer, R. (1994) Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals. Phys. Stat. Sol., (a) 143:277-287.
19. Goessens, C., Schryvers, D., Van Landuyt, J., Amelinckx, S., and De Keyzer, R. (1995) Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals. Surf. Sci., 337:153-165.
20. Gregory, C., Gijbels, R., Jacob, W., Geuens, I., Van Roost, C., and De Keyzer, R. (1997) Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy. J. Microsc., 188:79-87.
21. Hamilton, J. F. (1988) The silver halide photographic process. Adv. Phys., 37:359-441.
22. Hofer, F. (1995) Inner-shell ionization In: Energy-Filtering Transmission Electron Microscopy. Springer series in optical sciences, Vol. 71, L. Reimer, ed. Springer-Verlag, Berlin, pp. 225-268.
23. Hofmeister, H., Grosse, S., Gerth, G., and Haefke, H. (1994) Fractal model of superstructures on AgBr (111). Phys. Rev., 49:7646-7653.
24. Keyes, M.P., Philips, E.C., and Gladfelter, W.L. (1992). In situ atomic force microscopy of AgBr tabular grains: Surface effects of iodide. J. Imag. Sci. Technol., 36: 268-272.
25. King, M., Loretto, M, Maternaghan, T., and Berry, F.J. (1987) The investigation of iodide distribution by analytical electron microscopy. In: Progress in Basic Principles of Imaging Systems. F. Granzer and E. Moisar, eds. F. Vieweg & Sohn, Braunschweig, Wisbaden, Germany, pp. 73-79.
26. Kunz, A.B. (1982) Electronic structure of AgF, AgCl, and AgBr. Phys. Rev. 26:2070-2075.
27. Lavergne, J.L., Gimenez, C., Friour, G., and Martin, J.M. (1994a) Study of the iodide ion placement in silver halide grains by use of electron energy loss techniques and X-ray diffraction. In: Proc. Intern. Congr. Phot. Sci. ICPS'94/IS7T's 47th Ann. Conf. Vol.1, IS&T, Rochester, New York, pp.31-34.
28. Lavergne, J.L., Gimenez, C., Friour, G., and Martin, J.M. (1994b) Chemical mapping of silver halide microcrystals: use of imaging EELS methods. In: Proc. 13th Intern. Congr. Electr. Microsc. Vol.1, B. Jouffrey and C. Colliex, eds. Les Editions de Physique, Les Ulis, France, pp. 629-630.
29. Leapman, R.D., Rez, P., and Mayers, D.F. (1980) K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions. J. Chem. Phys. 72:1232-1243.
30. Malis, T., Cheng, S.C., and Egerton, R.F, (1988) EELS log-ratio technique for specimen-thickness measurement in the TEM. J. Electr. Microsc. Tech., 8:193-200.
31. Marchetti, A.P. and Burberry, M. (1988) Indirect optical absorption and radiative recombination in silver bromoiodide. Phys. Rev., B37:10862-10866.
32. Maskasky, J.E. (1987a) An enhanced understanding of silver halide tabular grain growth. J. Imag. Sci., 31:15-26.
33. Maskasky, J.E. (1987b) Novel silver bromide tabular grain edge growths and their use in determining the separation between parallel twin planes in the host grain. J. Imag. Sci., 31:93-99.
34. Maternaghan, T.J., Falder, C.J., Levi-Setti, R., and Chabala, J.M. (1990) Elemental mapping of silver halide emulsion microcrystals by high resolution imaging SIMS. J. Imag. Sci., 34:58-65.
35. Mitchell, J.W. (1991) Dislocations and photographic sensitivity. Part II. Dislocations in microcrystals of silver halides. J. Soc. Phot. Sci. Technol. Jpn, 54:258-272.
36. Oleshko, V.P, Alfimov, M.V., Cui, X.-F., and Wang, S.E. (1994) Study of sulphur sensitization products on the surface of tabular grains of silver halide emulsions by means of analytical electron microscopy and image analysis. J. Phot. Sci., 42:110-116.
37. Oleshko, V, Gijbels, R., Jacob, W., and Alfimov, M. (1995a) Characterization of complex silver halide photographic systems by means of analytical electron microscopy. Microbeam Anal., 4:1-29.
38. Oleshko, V, Gijbels, R., Jacob, W., Lakiere, F., Van Daele, A., Silaev, E., and Kaplun, L. (1995b) Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy-dispersive X-ray microanalysis. Microsc. Microanal. Microstruct., 6:79-88.
39. Oleshko, V., Gijbels, R. and Jacob, W. (1996) Energy-filtering TEM and electron energy-loss spectroscopy of double structure tabular microcrystals of silver halide emulsions J. Microsc. 183:27-38.
40. Reimer, L. (1995a) Introduction. In: Energy-Filtering Transmission Electron Microscopy. Springer series in optical sciences, Vol.71.Springer-Verlag, Berlin, pp.1-42.
41. Reimer, L. (1995b) Electron Spectroscopic Imaging In: Energy-Filtering Transmission Electron Microscopy. Springer series in optical sciences, Vol.71. Springer-Verlag, Berlin, pp.347-400.
42. Reimer, L., Fromm, I., and Naudorf, I. (1990) Electron spectroscopic diffraction. Ultramicroscopy, 32:80-91.
43. Rez, P. (1989) Inner-shell spectroscopy: An atomic view. Ultramicroscopy, 28:16-23.
44. Rogers, J.K., Toledo-Crow, R., Vaez-Irravani, M., Di Francesco, G., Zhao, T., and Hailstone, R. (1995) Correlative near-field direct/ fluorescence imaging and spectroscopy of a sensitizing dye on single microcrystals of silver halide. J. Imag. Sci. Technol., 39:205-210.
45. Savitsky, A., and Golay, M. (1964) Smoothing and differentiation of data by simplified least squares procedures. Anal. Chem., 36:1627-1639.
46. Schwarz, U.D., Haefke, H., Jung, T., Meyer, E., Guntherodt, H.-J., Steiger, R., and Bohonek, J. (1992) Atomic force microscopy study of tabular AgBr microcrystals (T-grains). J. Imag. Sci. Technol., 36:361-365.
47. Shiozawa, T., Iwatsuii, M., and Harada, Y. (1987) Observation of lattice images of silver bromide microcrystals by electron microscope with a superconducting magnet lens. J. Soc. Photogr. Sci. Technol. Jpn., 50:31-32.
48. Tan, Y.T. (1989) Ionic defects and the photographic process. J. Chem. Soc. Faraday Trans., II, 85:457-466.
49. Topfer, K., and Jacobson, R.E. (1993) A comparison between image quality parameters of tabular grain and onventional black-and white films. J. Photogr. Sci., 41: 35-42.
50. Tropf, W.J., Thomas, M.E. and Harris, T.J. (1995) Properties of crystals and glasses. In: Handbook of Optics, Vol. 2. M. Bass et al., eds. McGraw-Hill, New York, p. 33-56.
51. Van Dyck, D., De Ridder, Van Tendeloo, G., and Amelinckx, S. (1977) A cluster model for the transition state and its study by means of electron diffraction. III. Generalizations of the theory and relation to the SRO parameters. Phys. Stat. Sol. (a) 43:541-552.
52. Van Puymbroeck, J., Van Espen, P., and Jacob, W. (1989) Acquisition and analysis of electron energy-loss spectra. Micron Microsc. Acta, 20:155-156.
53. Van Puymbroeck, J., Jacob, W., and Van Espen, P. (1992) Methodology for spectrum evaluation in quantitative electron energy-loss spectrometry using the Zeiss CEM902. J. Microsc., 166: 273-286.
54. Verlinden, G., Janssens, G., Gijbels, R., Van Espen, P., and Geuens,I. (1997) Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis. Anal. Chem., 69:3772-3779.
55. von der Osten, W., and Stolz, H. (1990) Localized exciton states in silver halides. J. Phys. Chem. Solids, 51:765-791.
56. Wu, S., Van Daele, A., Jacob, W., Gijbels, R., Verbeek, A., and De Keyzer, R. (1992) Structural analysis of silver halide cubic microcrystals with epitaxial or conversion growths by STEM-EDX. Mikrochim.Acta(Suppl.), 12:261-268.
57. Wu, S., Van Daele, A., Jacob, W., Gijbels, R., Verbeek, A. and De Keyzer, R. (1993) Microanalysis of individual silver halide microcrystals. Scan. Microsc., 7:17-24.