Three-Dimensional Chemical Characterization of Complex Silver Halide Microcrystals by Scanning Ion Microprobe Mass Analysis

Analytical Chemistry

Volumn 69, Issue 18, 1997, Pages 3772-3779

  Verlinden, Geert ^a   Janssens, Gert ^a   Gijbels, Renaat ^a   Van Espen, Piet ^a   Geuens, Ingrid ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000715578     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac970010r     Document Type: Article

References (32)

1. De Keyzer R. Proceedings 47th Annual Conference of Imaging Science and Technology, Rochester, NY, 1994; pp 22-23.
2. Geuens I. Ph.D. Thesis, University of Antwerp, Wilrijk, 1993.
3. Geuens I.; Gijbels R; De Keyzer R.; Verbeeck A. Proceedings 47th Annual Conference of Imaging Science and technology, Rochester, NY, 1994; pp 27-30.
4. Geuens I.; Gijbels R.; Jacob W. In Secondary Ion Mass Spectrometry, SIMS VIII; Benninghoven, A., et al., Eds.; Wiley & Sons: Chichester, UK, 1992; pp 49-52.
5. Janssens G. Ph.D. Thesis, University of Antwerp, Wilrijk, 1995.
6. Lee J. C.; Kang H. J.; Kim K. J.; Kim Y. S.; Moon D. W. Surf. Sci. 1995, 324, 338-344.
7. Zalm P. Rep. Prog. Phys. 1995, 58, 1321-1374.
8. Schuhmacher M.; de Chambost E.; McKeegan K. D.; Harrisson T. M.; Migeon H. N. In Secondary Ion Mass Spectrometry, SIMS IX; Benninghoven, A., et al., Wiley & Sons: Chichester, UK, 1994; pp 919-922.
9. Valaskovic G. A.; Morrison G. H. Scanning Microsc. 1992, 6, 2, 305-318.
10. Gillen G.; Kaiser D. L.; Wallace J. S. Surf. Int. Anal. 1991, 17, 7-14.
11. Gillen G.; Bright D.; Lorincik J.; Mogren S. In Secondary Ion Mass Spectrometry, SIMS X; Benninghoven, A., et al.; Wiley & Sons: Chichester, UK, 1997; pp 321-324.
12. Rüdenauer F. G. Anal. Chim. Acta 1994, 297, 197-230.
13. Linton R. W.; Williams P.; Evans C. A., Jr.; Natusch D. F. S. Anal. Chem, 1977, 49, 1514-1521.
14. Cox X. B.; Bryan S. R.; Linton R. W.; Griffis D. P. Anal. Chem. 1987, 59, 2018-2023.
15. Briggs D.; Seah M. P. Practical Surface Analysis:Ion and neutral spectroscopy; Wiley & Sons: New York, 1990; Vol. 2.
16. Wilson R. G.; Stevie F. A.; Magee C. W. Secondary ion mass Spectrometry; Wiley & Sons: New York, 1989.
17. Cameca IMS 4f, Manual, Courbevoie, France.
18. Benninghoven A.; Rudenauer F. G.; Werner H. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications and trends; Wiley & Sons: New York, 1987.
19. IBAS Image Processing System, User's Manual v2.0, Kontron Elektronik GmbH, 1990.
20. Vanhoolst W. K.; Van Espen P. Mikrochim. Acta 2 1991, 415-425.
21. Férauge C.; Janssens G.; Van Espen P. In Secondary Ion Mass Spectrometry, SIMX X; Benninghoven, A., et al.; Wiley & Sons: Chichester, UK, 1997.
22. Van Puymbroeck J.; Gijbels R.; Ketellapper L. W. Proc. Euroanal. V 1984, 117.
23. Wu. S. Ph.D. Thesis, University of Antwerp, Wilrijk, 1992.
24. Vickermann J.; Brown A.; Reed N. M. Secondary Ion Mass Spectrometry; Clarendon Press: Oxford, UK, 1989.
25. Anderson H.; Bay H. Sputtering by particle bombardment I; Springer Verlag: Berlin, 1981; pp 145-218.
26. Verlinden G., unpublished results.
27. Granzer F. J. Imaging Sci. 1989, 33 (6), 207-216.
28. Klein E.; Moisar E. Ber. Bunsenges. Phys. Chem, 1963, 67, 349, 949.
29. Markocki W. J. Photogr. Sci. 1964, 13, 85.
30. Hamilton J. F. Adv. Phys. 1988, 37 (4), 359-441.
31. Okusa H.; Matsuzaka S.; Iwamura S-I.; Shima T. Proceedings 47th Annual conference of Imaging Science and Technology, 1994; pp 27-30.
32. Steiger R. Chimia 1994, 48, 9, 444-446.