Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy

Journal of Microscopy

Volumn 188, Issue 1, 1997, Pages 79-87

  Gregory, C ^a   Gijbels, R ^a   Jacob, W ^a   Geuens, I ^b   Van Roost, C ^b   De Keyzer, R ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Scanning transmission electron microscopy; Sectioning; Silver halide microcrystals; Ultramicrotomy; X ray analysis

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROCRYSTALS; SILVER HALIDES; X RAY ANALYSIS;

ANALYTICAL ELECTRON MICROSCOPY; CHARACTERIZATION METHODS; ELECTRON IMAGES; SCANNING ELECTRONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SECTIONING; SILVER HALIDE MICROCRYSTALS; THIN-SECTIONS; ULTRA-MICROTOMY; X-RAY MAPS;

SCANNING ELECTRON MICROSCOPY;

SILVER HALIDE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; DIAGNOSTIC PROCEDURE; ELECTRON MICROSCOPY; PRIORITY JOURNAL; QUANTITATIVE DIAGNOSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 0030667830     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.2300790.x     Document Type: Article

References (11)

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