Energy-filtering TEM and electron energy-loss spectroscopy of double structure tabular microcrystals of silver halide emulsions

Journal of Microscopy

Volumn 183, Issue 1, 1996, Pages 27-38

  Oleshko, V ^a,b   Gijbels, R ^a   Jacob, W ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b SEMENOV INSTITUTE OF CHEMICAL PHYSICS   (Russian Federation)

Author keywords

AEM; composite tabular microcrystals of silver halide emulsions; crystal thickness; dislocations; EDX; EELS; energy filtering TEM; inner shell excitations; plasmons; selected area electron diffraction; stacking faults

Indexed keywords

CATHODOLUMINESCENCE; DISSOCIATION; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; PHOTOGRAPHIC EMULSIONS; SHELLS (STRUCTURES); SILVER HALIDES; STACKING FAULTS;

AEM; COMPOSITE TABULAR MICROCRYSTAL OF SILVER HALIDE EMULSION; CRYSTAL THICKNESS; DISLOCATION; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ENERGY-DISPERSIVE X-RAYS; ENERGY-FILTERING TEM; INNER SHELL EXCITATION; SELECTED AREA ELECTRON DIFFRACTION; SILVER HALIDE EMULSION; TABULAR MICROCRYSTALS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

SILVER DERIVATIVE;

CONFERENCE PAPER; CRYSTAL; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; EMULSION; PRIORITY JOURNAL; QUANTUM CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0029684080     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.73068.x     Document Type: Conference Paper

References (58)

1. Ahn, C.C. & Krivanek, O.L. (1983) EELS Atlas. Center for Solid State Science, Arizona State University, Tempe, AZ. and Gatan Inc., Warrendale, PA.
2. Baetzold, R.C. & Berry, C.R. (1977) Structural defects and ionic conductivity. The Theory of the Photographic Process (ed. by T.H. James), pp. 12-25. Macmillan Publ., New York.
3. Bakenfelder, L. Fromm, L., Reimer, L. & Rennekamp, R. (1990) III. Brags contrast of crystalline specimens. J. Microsc. 159, 161-177.
4. Batson, P.H. (1989) Spatially resolved electron energy loss spectroscopy. Microbeam Analysis-1989 (ed. by P.E. Russel). pp. 5-10. San Francisco Press, San Francisco.
5. Berriman, R.W. & Herz, R.H. (1957) Twinning and the tabular growth of silver bromide crystals. Nature, 180, 293-294.
6. Black, D.L., Lam, W. & Timmons, J.A. (1994) A detailed examination of twin planes in silver halide grains. Proc. Int. Congr. Phot. Sci. ICPS'94/IS & T's 47th Ann. Conf., Vol. 1. pp. 26-27. IS & T, Rochester, New York.
7. Black, D.L. & Timmons, J.A. (1994) Three-dimensional halide analysis of individual silver halide grains, using AEM. Imag. Sci. Technol 38, 10-13.
8. Castaing, R. & Henry, L. (1962) Filtrage magnetique des vitesses en microscopic electronique. C. R. Acad. Sci. (Paris), 255, 76-78.
9. Daniels, J., von Ferstenberg, C. & Raether, H. (1970) Optical constants of solids by electron spectroscopy. Springer Tracts in Modern Physics (ed. by G. Hohler). Vol. 54, pp. 77-135. Springer-Verlag, Berlin.
10. De Ridder, R., Van Dyck, D., Van Tendeloo, G. & Amelinckx, S. (1977) A cluster model for the transition state and its study by means of electron diffraction. II. Application to some particular systems. Phys. Status Solidi (a). 40, 669-683.
11. De Ridder, R., Van Tendeloo, G., Van Dyck, D. & Amelinckx, S. (1976) A cluster model for the transition state and its study by means of electron diffraction. Phys. Status Solidi (a), 38, 663-674.
12. Doniach, S. & Sommers, C. (1985) Coherence of inelastically scattered fast electrons in crystals of finite thickness. Phil. Mag. A51, 419-427.
13. Duval, P.H. & Henry, L. (1977) Calcul de l'influence de la diffusion inelastique des electrons sur les images de monocristaux. Philos. Mag. 35, 1381-1385.
14. Egerton, R.F. (1986) Electron Energy-Loss Spectroscopy in the Electron Microscope, pp. 255-262. Plenum Press, New York.
15. Egerton, R.F. & Wang. Z.L. (1990) Plural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting aperture. Ultramicroscopy. 32, 137-148.
16. Farnell, G.C. & Judd, F.S. (1961) A technique for examination of the edge faces of tabular microcrystals applied to silver-bromide grains for evidence of twinning. J. Phot. Sci. 9, 67-69.
17. Gao, X.-L., Gijbels, R., Nys, B., Jacob, W. & Gilliams, Y. (1989) A new and convenient method for the analysis of the halide distribution in tabular photographic silver halide microcrystals by backscattered electron imaging. J. Imag. Sci. 33, 87-91.
18. Geuens, I., Gijbels, R., Jacob, W., Verbeeck, A. & De Keyzer, R. (1992) Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing. J. Imag. Sci. Technol. 36, 534-539.
19. Goessens, C., Schryvers. D., Van Dyck, D., Van Landuyt, J. & De Keyzer, R. (1994) Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals. Phys. Status Solidi (a), 143, 277-287.
20. Goessens, C., Schryvers, D., Van Landuyt. J., Amelinckx, S., Verbeeck, A. & De Keyzer, R. (1991) Characterisation of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry. J. Cryst. Growth, 110, 930-941.
21. Goessens, C., Schryvers, D., Van Landuyt, J., Amelinckx, S. & De Keyzer, R. (1995) Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals. Surf. Sci. 337, 153-165.
22. Goldstein, J.L. & Williams, D.B. (1992) X-ray microanalysis and electron energy loss spectrometry in the analytical electron microscope: review and future directions. Microbeam Anal. 1, 29-53.
23. Haefke, H., Schwartz, U.D., Guntherodt, H.-J., Frob, H. Gerth, G. & Steiger, R. (1993) Investigation of AgBr photographic systems with scanning force microscopy. J. Imag. Sci. Technol. 37, 545-551.
24. Hamilton, J.F. & Brady, L.E. (1964) Twinning and growth of silver bromide microcrystals. J. Appl. Phys. 35, 415-416.
25. Hegenbart, G. & Mussig, T. (1993) Atomic force microscopy studies of AgBr crystals. J. Imag. Sci. Technol. 37, 551-558.
26. Hegenbart, G. & Mussig, T. (1994) Atomic force microscopy studies of silver halide crystals. Proc. Int. Congr. Phot. Sci. ICPS'94/ IS & T's 47th Ann. Conf., Vol. 1, pp. 39-45. IS & T. Rochester. New York.
27. Hirsch, P. & Reimer, L. (1994) Influence of zero-loss filtering on electron optical phase contrast. J. Microsc. 174, 143-148.
28. Hofmeister, H., Grosse, S., Gerth, G. & Haefke, H. (1994) Fractal model of superstructures on AgBr (111). Phys. Rev. 49, 7646-7653.
29. Keyes, M.P., Philips, E.C. & Gladfelter (1992) In situ atomic force microscopy of AgBr tabular grains: surface effects of iodide. J. Imag. Sci. Technol. 36, 268-272.
30. King, M., Loretto, M., Maternaghan, T. & Berry, F.J. (1987) The investigation of iodide distribution by analytical electron microscopy. Progress in Basic Principles of Imaging Systems (ed. by F. Granzer and E. Moisar). pp. 75-79. F. Vieweg & Sohn. Brauschweig, Wiesbaden.
31. Lavergne, J.L., Gimenez, C., Friour, G. & Martin, J.M., (1994) Study of the iodide ions placement in silver halide grains by use of electron energy loss techniques and X-ray diffraction. Proc. Int. Congr. Phot. Sci. ICPS'94/IS& T's 47th Ann. Conf., Vol. 1. pp. 31-34. IS&T, Rochester, New York.
32. Lavergne, J.L., Gimenez, C., Friour, G. & Martin, J.M. (1994) Chemical mapping of silver halide microcrystals: use of imaging EELS methods. Proc. 13th Int. Congr. on Electron Microscopy. Vol. 1 (ed. by B. Jouffrey and C. Colliex). pp. 629-630. Les edns de Physique. Les Ulis.
33. Lavergne, J.L., Gimenez, C. & Martin, J.M. (1992) Characterisation of silver halide tabular grains using electron energy loss spectroscopy. Proc. 10th Eur. Congr. on Electron Microscopy. Vol. 1 (ed. by A. Rios, J.M. Arias, L. Megias-Megias and A. Lopez-Galindo), p. 267. University of Granada Publ., Granada, Spain.
34. Malis, T., Cheng, S.C. & Egerton, R.F. (1988) EELS log-ratio technique for specimen-thickness measurement in the TEM. J. Electron Microsc. Tech. 8, 193-200.
35. Maskasky, J.E. (1987a) An enhanced understanding of silver halide tabular grain growth. J. Imag. Sci. 31, 15-26.
36. Maskasky, J.E. (1987b) Novel silver bromide tabular grain edge growths and their use in determining the separation between parallel twin planes in the host grain. J. Imag. Sci. 31, 93-99.
37. Maternaghan, T.J., Falder, C.J., Levi-Setti, R. & Shabala, J.M. (1990) Elemental mapping of silver halide emulsion microcrystals by high resolution imaging SIMS. J. Imag. Sci. 34, 58-65.
38. Mehta, R.V., Jagannathan, R., Lam, W.K., Black, D.L. & Timmons, J.A. (1995) An examination of the relationship between crystal shape and structural features of silver halide tabular crystals. J. Imag. Sci. Technol. 39, 67-69.
39. Mehta, R.V., Jagannathan, R. & Timmons. J.A. (1993) Insights into growth mechanism of silver halide tabular crystals: cubooctahedral side faces. J. Imag. Sci. Technol. 37, 107-116.
40. Mitchell, J.W. (1991) Dislocations and photographic sensitivity. Part II. Dislocations In microcrystals of silver halides. J. Soc. Phot, Sci. Technol. Jpn. 54, 258-272.
41. Oleshko, V.P., Alfimov, M.V., Cui. X.-F. & Wang, S.E. (1994) Study of sulphur sensitisation products on the surface of tabular grains of silver halide emulsions by means of analytical electron microscopy and image analysis. J. Phot. Sci. 42, 110-116.
42. Oleshko, V., Gijbels, R., Jacob, W. & Alfimov, M. (1995a) Characterisation of complex silver halide photographic systems by means of analytical electron microscopy. Microbeam Anal. 4, 1-29.
43. Oleshko, V., Gijbels, R., Jacob, W., Lakiere, F., Van Daele, A., Silaev, E. & Kaplun, L. (1995b) Characterisation of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy. zero-loss electron spectroscopic imaging and energy-dispersive X-ray microanalysis. Microsc. Microanal. Microstruct. 6, 79-88.
44. Raeymaekers, B.J., Liu, X., Janssens, K.H., Van Espen, P. & Adams, E.C. (1987) Determination of the thickness of flat particles by automated electron microprobe analysis. Anal. Chem. 59, 930-937.
45. Reimer, L. (1991) Energy-filtering transmission electron microscopy. Adv. Electron. Electron Phys. 81, 43-126.
46. Reimer, L. (1992) Energy-filtering, transmission electron microscopy in materials science. Microsc. Microanal. Microstruct. 3, 141-157.
47. Reimer, L., Fromm, I. & Naudorf. I. (1990) Electron spectroscopic diffraction. Ultramicroscopy, 32, 80-91.
48. Reimer, L. & Ross-Messemer, M. (1989) Contrast in the electron spectroscopic imaging mode of a TEM. 1. Influence of zero-loss filtering on scattering contrast, J. Microsc. 155, 169-182.
49. Reimer, L. & Ross-Messemer, M. (1990) Contrast in the electron spectroscopic imaging mode of a TEM. II. Z-ratio, structure-sensitive and phase contrast. J. Microsc. 159, 143-160.
50. Scott, V.D., Love, C. & Reed, S.J.B. (1995) Quantitative Electron-Probe Microanalfisis. 2nd edn, pp. 270-276. Ellis Horwood, Bodmin, U.K.
51. Schwarz. U.D., Haefke, H., Jung, T., Meyer, H., Guntherodt. H.-J., Steiger, R. & Bohonek, J. (1992) Atomic force microscopy study of tabular AgBr microcrystals (T-grains). J. Imag. Sci. Technol. 36, 361-365.
52. Schwarz, U.D., Haefke, H., Jung, T., Meyer, K. & Guntherodt, H.-J. (1994) Tip artefacts in scanning force microscopy. J. Microsc. 173, 185-197.
53. Tan, V.T. (1989) Ionic defects and the photographic process. J. Chem. Soc. Faraday Trans. II. 85. 457-466.
54. Topfer, K. & Jacobson, R.E. (1993) A comparison between image quality parameters of tabular grain and conventional black-and white films. J. Photogr. Sci. 41, 55-42.
55. Tropf, W.J., Thomas, M.E. & Harris. T.J. (1995) Properties of crystals and glasses. Handbook of Optics (ed. by M. Bass et al.), Vol. 2, p. 33-56. McGraw-Hill, New York.
56. Van Dyck, D., De Ridder, Van Tendeloo, G. & Amelinckx, S. (1977) A cluster model for the transition state and its study by means of electron diffraction. III. Generalisations of the theory and relation to the SRO parameters. Phys. Status Solidi (a), 43, 541-552.
57. Van Puymbroeck, J., Van Espen, P. & Jacob, W., (1989) Acquisition and analysis of electron energy-loss spectra. Micron Microsc. Acta. 20, 155-156.
58. Wu, S., Van Daele, A., Jacob, W., Gijbels, R., Verbeek, A. & De Keyzer, R. (1993) Microanalysis of individual silver halide microcrystals. Scanning Microsc. 7, 17-24.