Simple, accurate method for characterising two-port devices with small reflections

Electronics Letters

Volumn 34, Issue 18, 1998, Pages 1761-1763

  Wan, Changhua ^a  

^a UNIVERSITY OF TROMSØ   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT;

TWO-PORT DEVICES;

FIBER OPTIC NETWORKS;

EID: 0032480204     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19981267     Document Type: Article

References (7)

1. ENGEN, G.F., and HOER. CA.: "Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer', IEEE Trans. Microw. Theory Tech., 1979, MTT-27, pp. 987-993
2. MARKS, R.B.: 'A multiline method of network analyzer calibration', IEEE Trans. Microw. Theory Tech., 1991, MTT-39, pp. 1205-1215
3. LEE, M.-Q., and NAM, S.: 'An accurate broadband measurement of substrate dielectric constant', IEEE Microw. Guid. Wave Lett., 1996, 6, (4), pp. 168-170
4. BACK, K.-H., SUNG, H.-Y., and PARK, W.S.: 'A 3-position transmission/ reflection method for measuring the permittivity of low loss materials', IEEE Microw. Guid. Wave Lett., 1995, 5, (1), pp. 3-5
5. WAN, C., NAUWELAERS, B., DE RAEDT, W., and VAN ROSSUM, M.: 'Complex permittivity measurement method based on asymmetry of reciprocal two-ports', Electron. Lett., 1996, 32, (16), pp. 1497-1498
6. WAN, C., NAUWELAERS, B., DE RAEDT, W., and VAN ROSSUM, M.: 'Two new measurement methods for explicit determination of complex permittivity', IEEE Trans. Microw. Theory Tech., (accepted for publication)
7. WAN, C.: 'A simple error correction method for two-port transmission parameters measurement', IEEE Microw. Guid. Wave Lett., 1998, 8, (2), pp. 58-59