Near-field phase measurement by Fourier analysis of the fringe pattern

Pure and applied optics

Volumn 6, Issue 5, 1997, Pages 491-502

  Charraut, D ^a   Bainier, C ^a   Courjon, D ^a   Girard, C ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; FOURIER TRANSFORMS; INTERFEROMETRY; MICROSCOPES;

FRINGE PATTERN; NEAR FIELD MICROSCOPY;

PHASE MEASUREMENT;

EID: 0031234849     PISSN: 09639659     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-9659/6/5/002     Document Type: Article

References (16)