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Volumn 194, Issue 2, 1998, Pages 189-194

Growth of high-quality buried Y- And (Y, Nd)-silicide layers prepared by channelled ion implantation

Author keywords

Epitaxial growth; Ion implantation; Transmission electron microscopy

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; ION IMPLANTATION; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

EID: 0032476404     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00715-5     Document Type: Article
Times cited : (3)

References (20)
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.