Effect of roughness correlations in multilayers on Bragg peaks in X-ray diffuse scattering

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 34-43

  Kaganer, V M ^a,b   Stepanov, S A ^a,c   Kohler R ^a  

^a MPG AG Röntaenbeugung   (Germany)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c INSTITUTE FOR NUCLEAR PROBLEMS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTROMAGNETIC WAVE SCATTERING; INTERFACES (MATERIALS); SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

BRAGG PEAKS; X RAY DIFFUSE SCATTERING;

SEMICONDUCTOR SUPERLATTICES;

EID: 0030562919     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00902-7     Document Type: Article

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