Angular-resolved valence-band spectroscopy of different reconstructed 3C-SiC (001) surfaces

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 6, 1998, Pages 3471-3476

  Lubbe M ^a   Lindner, K ^a   Sloboshanin, S ^b   Tautz, S ^b   Schafer J ^b   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032346196     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581505     Document Type: Article

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