Current radiation issues for programmable elements and devices

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2600-2609

  Katz, R ^a   Wang, J J ^b   Koga, R ^c   Label, K A ^a   McCollum, J ^b   Brown, R ^c   Reed, R A ^b   Cronquist, B ^c   Crain, S ^a   Scott, T ^a   Paolini, W ^c   Sin, B ^c  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Actel Corp   (United States)

^c LOCKHEED MARTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DESIGN; RADIATION HARDENING;

PROGRAMMABLE LOGIC DEVICES; RADIATION HARDNESS;

LOGIC DEVICES;

EID: 0032312005     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736503     Document Type: Article

References (13)

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2. J.M. Benedetto, C. C. Hafer, A. R. Oliver, and D. B. Kerwin, "Amorphous Silicon Antifuse Programmable Array Logic Devices for High Reliability Space Applications," Government Microcircuits Applications Conference Digest of Papers, pp. 303-306, March 16-19, 1998, Arlington, VA.
3. J. Banker, Pico Systems, Inc., private communication.
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9. IEEE STD 1149.1-1990, IEEE Standard Test Access Port And Boundary-Scan Architecture, IEEE Computer Society (1993).
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11. R. Padovani, Xilinx Corporation, private communication.
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13. P. Alfke, and R. Padovani, "Radiation Tolerance of HighDensity FPGAs," accepted for publication in the 1998 Military and Aerospace Programmable Logic Device Conference Proceedings, September 15-16,1998, Greenbelt, MD.