Seu hardening of field programmable gate arrays (fpgas) for space applications and device characterization

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2179-2186

  Katz, R ^a   Barto, R ^b   McKerracher, P ^c   Carkhuff, B ^c   Koga, R ^d  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b INTELSAT   (United States)

^c JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

^d AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CELLULAR ARRAYS; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; RADIATION EFFECTS; SPACE APPLICATIONS; TRANSIENTS;

FIELD PROGRAMMABLE GATE ARRAYS; FLIP FLOP HARDENING; SINGLE EVENT UPSETS;

LOGIC GATES;

EID: 0028712340     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340560     Document Type: Article

References (6)

1. Koga, R., W.R. Crain, K.B. Crawford, S.J. Hansel, S.D. Pinkerton, and T.K. Tsubota, “The Impact of ASIC Devices on the SEU Vulnerability of Spaceborne Computers,” IEEE Transactions on Nuclear Science, Vol. 39, No. 6, pp. 1685–1692, 1992.
2. Buchner, S. K. Kang, D. Krening, G. Lannan, and R. Schneiderwind, “Dependence of the SEU Window of Vulnerability of a Log i c Circuit on Magnitude of Deposited Charge,” IEEE Transactions on Nuclear Science, Vol. 40, No. 6, pp. 1853–1857, 1993.
3. Katz, R., A. Sharma, R. Barto, P. McKerracher, R. Koga, K. Sahu, G. Swift, and B. Carkhuff, “On Dual-Use of Commercial Technology in Spacecraft Radiation-Hardened/High-Reliability Hardened/High-Reliability Applications: A Case Study Using Field Programmable Gate Arrays,” to be published as a NASA Technical Memorandum.
4. Nichols, D.K., M.A. Huebner, W.E. Price, L.S. Smith, and J.R. Coss, HEAVY ION INDUCED SINGLE EVENT PHENOMENA (SEP) DATA FOR SEMICONDUCTOR DEVICES FROM ENGINEERING TESTING, JPL Publication 88–17, July 1988.
5. Actel Corporation, FPGA DATA BOOK AND DESIGN GUIDE, 1994.
6. Koga, R., S.D. Pinkerton, T.J. Lie, and K.B. Crawford, “Single-word Multiple-bit Upsets in Static Random Access Devices,” IEEE Transactions on Nuclear Science, Vol 40, No. 6, pp. 1941–1946, 1993.