Lateral ordering of self-assembled Ge islands

Thin Solid Films

Volumn 336, Issue 1-2, 1998, Pages 252-255

  Zhu, Jian Hong ^a   Brunner, K ^a   Abstreiter, G ^a   Kienzle, O ^b   Ernst, F ^b  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Atomic force microscopy; Ge island; Molecular beam epitaxy; Self ordering; Step bunching; Vicinal surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SEMICONDUCTOR SUPERLATTICES;

LATERAL ORDERING;

SEMICONDUCTING FILMS;

EID: 0032310615     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01245-0     Document Type: Article

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