Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2833-2841

  Reed, R A ^a   Marshall, P W ^a   Johnston, A H ^a   Barth, J L ^b   Marshall, C J ^b   Label, K A ^b   D'Ordine, M ^b   Kim, H S ^b   Carts, M A ^b  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC CURRENTS; RADIATION DAMAGE;

CURRENT TRANSFER RATIO; OPTOCOUPLERS; SINGLE EVENT TRANSIENT EFFECTS;

OPTOELECTRONIC DEVICES;

EID: 0032306171     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736536     Document Type: Article

References (15)

1. B.G. Rax, C. I. Lee, A. H. Johnston, C. E. Barnes, "Total Dose and Displacement Damage in Optocouplers", IEEE Trans, on Nuclear Science, Vol. 43, no. 6, pp. 3167-3173, Dec 1996.
2. A.S. Epstein and P. A. Trimmer, "Radiation Damage and Annealing Effects in Phonton Coupled Isolators," IEEE Trans, on Nuclear Science, vol 19, no. 6, pp. 391, Dec. 1972.
3. K.J. Soda, C. E. Barnes, and R. A. Kiehl, "The Effect of Gamma Irradiation on Optical Isolators," IEEE Trans, on Nuclear Science, vol 22, pp. 2475, Dec. 1975.
4. C.E. Barnes and J. J. Wiczer, "Radiation Effects in Optoelectronic Devices," Sandia Report, SAND84-0771, 1984
5. M.D. D'Ordine, "Proton Displacement Damage in Optocouplers", 1997 IEEE Radiation Effects Workshop Record, IEEE No. 97TH8293, pp. 122-124, 1997
6. K.A. LaBel, P. W. Marshall, C. J. Marshall, M. D'Ordine, M. A. Carts, G. Lum, H. S. Kim, C. M. Seidleck, T. Powell, R. Abbott, J. L. Barth, E. G. Stassinopoulos, "Proton-Induced Transients in Optocouplers: In-Flight Anomalies, Ground Irradiation Test, Mitigation and Implications, IEEE Trans, on Nuclear Science, Vol. 44, no. 6, pp. 1885-1892, Dec. 1997.
7. R. Koga, S.H. Penzin, W. R Grain, S. C Moss, S. D. Pinkerton, S. D. LaLumondiere, and M. C. Mäher, , "Single Event Upset (SEU) Sensitivity Dependence of Linear Integrated Circuits (ICs) on Bias Conditions," IEEE Trans, on Nuclear Science, vol 44, no. 6, pp. 2325-2332, Dec. 1997.
8. R. Ecoffet, S. Duzellier, P. Tastet, C. Aicardi, M. LaBrunee, "Observation of Heavy Ion Induce transients in Linear Circuits," 1994 IEEE Radiation Effects Workshop Record, IEEE No. 94TH06841, pp. 72-78, 1994.
9. C.J. Dale, P. W. Marshall, O. P. Summers, and E. A. Wolicki, "Displacement Damage Equivalent to Dose in Silicon Devices," Appl. Phys. Lett. , Vol. 54, No. 5, pp. 451-453, Jan. 1989.
10. C.J. Dale, P. W. Marshall, B. Cummings, L. Shamey, and A. Delamere, "Spacecraft Displacement Damage Dose Calculations for Shielded CCDs," SPIE Vol. 1656, pp. 476-487, 1992.
11. G.P. Summers, E. A. Burke, M. A. Xapsos, C. J. Dale, P. W. Marshall, and E. L. Petersen, "Displacement Damage in GaAs Structures," IEEE Trans. Nucl. Sei. , Vol. NS-35, No. 6, pp. 1221-1226, Dec. 1988.
12. S.M. Khanna, A. Houdayer, A. Jorio, C. Carlone, M. Parenteau, and J. W. Gerdes, Jr. , "Nuclear Radiation Displacement Damage Prediction in Gallium Arsenide through Low Temperature Photoluminesence Measurements,"IEEE Trans. Nucl. Sei. , Vol. NS-43, No. 6, pp. 2601-2608, Dec. 1996.
13. NASA/GSFC Radiation effects homepage, http://flick. gsfc. nasa. gov/radhome. htm
14. P.W. Marshall, C. J. Dale, M. A. Carts, and K. A. LaBel, "Particle-Induced Bit Errors in High Performance Fiber Optic Data Links for Satellite Data Management," IEEE Trans. Nucl. Sei. , Vol. 41, pp. 1958-1965, Dec. 1994.
15. C.J. Marshall, P. W. Marshall, M. A. Carts, R. A. Reed, K. A. LaBel, "Proton-Induced Transient Effects in a MetalSemiconductor-Metal (MSM) Photodetector for Optical-Based Data Transfer," to be published in IEEE Trans Nucl. Sei. , NS-45, No. 6, Dec 1998