In situ probing by fluorescence spectroscopy of the formation of continuous highly-ordered lamellar-phase mesostructured thin films

Langmuir

Volumn 14, Issue 26, 1998, Pages 7331-7333

  Huang, Michael H ^a   Dunn, Bruce S ^a   Soyez, Hermes ^a   Zink, Jeffrey I ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; FILM GROWTH; FLUORESCENCE; INTERFEROMETRY; MICELLES; SILICON COMPOUNDS; SOLS; SULFUR COMPOUNDS; SURFACE ACTIVE AGENTS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; X RAY CRYSTALLOGRAPHY;

DIP COATING; SODIUM DODECYL SULFATE; TETRAETHOXYSILATE;

THIN FILMS;

EID: 0032293213     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981298y     Document Type: Article

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