Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 12 PART 1, 1998, Pages 2068-2073

  Berghoff, Gerald ^a   Bergeault, Eric ^b   Huyart, Bernard ^b   Jallet, Louis ^b  

^a TELECOM PARISTECH   (France)

^b NOKIA   (Germany)

Author keywords

Load pull; Measurement automation; Multiharmonic; Nonlinear; Six port; Source pull

Indexed keywords

ALGORITHMS; ELECTRIC IMPEDANCE; MESFET DEVICES; POWER ELECTRONICS; REFLECTOMETERS; SEMICONDUCTING GALLIUM ARSENIDE;

POWER TRANSISTORS; SIX-PORT REFLECTOMETERS;

MICROWAVE DEVICES;

EID: 0032291248     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.739284     Document Type: Article

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