On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 5, 1997, Pages 1111-1114

  Berghoff, Gerald ^a   Bergeault, Eric ^a   Huyart, Bernard ^a   Jallet, Louis ^a  

^a TELECOM PARISTECH   (France)

Author keywords

Absolute power measurements; De embedding techniques; Double six port; Load pull; Nonlinear measurements; On wafer calibration

Indexed keywords

CALIBRATION; ELECTRIC POWER MEASUREMENT; REFLECTOMETERS;

ON WAFER MEASUREMENTS;

ELECTRIC NETWORK ANALYZERS;

EID: 0031250186     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.676722     Document Type: Article

References (9)

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