Low frequency noise spectroscopy in MOS and bipolar devices

Microelectronic Engineering

Volumn 40, Issue 3-4, 1998, Pages 167-179

  Brini, J ^a  

^a Grenoble INP Phelma   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTION BIPOLAR TRANSISTORS; INTERFACES (MATERIALS); MOSFET DEVICES; SEMICONDUCTOR DEVICE MODELS; SPECTROSCOPIC ANALYSIS; SPURIOUS SIGNAL NOISE;

LOW FREQUENCY NOISE SPECTROSCOPY;

MOS DEVICES;

EID: 0032208577     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(98)00268-8     Document Type: Article

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