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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 11, 1998, Pages 5870-5874

Scanning tunneling microscopy study of faceting on vicinal Si(113)

(3) Sudoh, Koichi a Yoshinobu, Tatsuo a Iwasaki, Hiroshi a

a OSAKA UNIVERSITY (Japan)

Author keywords

Faceting; Scanning tunneling microscopy; Step; Vicinal Si(113)

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; HIGH TEMPERATURE EFFECTS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

FACETING;

SEMICONDUCTING SILICON;

EID: 0032203112 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.5870 Document Type: Article

Times cited : (4)

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