Fault Detection and Classification in Linear Integrated Circuits: An Application of Discrimination Analysis and Hypothesis Testing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 12, Issue 1, 1993, Pages 102-113

  Epstein, Benjamin R ^a   Czigler, Martin ^b   Miller, Steven R ^c  

^a ORANGE LABS   (France)

^b David Sarnoti Research Center ^*  (United States)

^c SRI INTERNATIONAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746099176     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.184847     Document Type: Article

References (23)

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