Analysis of Si/Si-1-xGex retrograded double quantum well p-type MOSFET

Semiconductor Science and Technology

Volumn 13, Issue 9, 1998, Pages 999-1005

  Chretien, O ^a   Yousif, M Y A ^a   Nur, O ^a   Patel, C J ^a   Willander, M ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MULTILAYERS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; THRESHOLD VOLTAGE;

HOLES DENSITIES; SILICON SURFACE CHANNELS;

MOSFET DEVICES;

EID: 0032156639     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/9/006     Document Type: Article

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