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Volumn 41, Issue 10, 1997, Pages 1493-1502

High-performance Si-SiGe HBTs SiGe-technology development in Esprit Project 8001 TIBIA: An overview

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING;

EID: 0031247476     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00095-6     Document Type: Article
Times cited : (12)

References (15)
  • 3
    • 0029276715 scopus 로고    scopus 로고
    • Harame, D. L., et al., IEEE Trans. Electr. Dev., 1995, 42, 455 (part-I) & 469 (part-II).
    • IEEE Trans. Electr. Dev. , Issue.2 PART , pp. 469
  • 12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.