Minimax approach to accelerated life tests

IEEE Transactions on Reliability

Volumn 47, Issue 3 PART 1, 1998, Pages 261-267

  Ginebra, Josep ^a,b   Sen, Ananda ^a  

^a ETSEI de Barcelona ^*  (Spain)

^b OAKLAND UNIVERSITY   (United States)

Author keywords

D optimality; Lognormal regression; Minimax; Robust design; Type 1 censoring; Var optimality; Weibull regression

Indexed keywords

COMPUTER SIMULATION; LIFE CYCLE; MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTIMIZATION; REGRESSION ANALYSIS; SERVICE LIFE; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTS; BAYES METHOD; MINIMAX METHOD;

RELIABILITY;

EID: 0032156578     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.740498     Document Type: Article

References (15)

1. K, Chaloner, K. Larntz, "Bayesian design for life testing", 3. Statistical Planning and Inference, vol 33, 1992, pp 245 - 259.
2. H. Chernoff, "Optimal accelerated life designs for estimation", Technometrics, vol 4, 1962, pp 381 - 408.
3. L.A. Escobar, W.Q. Meeker Jr, "Fisher information matrix for the extreme value, normal, and logistic distributions and censored data", Applied Statistics, vol 43, 1994, pp 533 - 540.
4. L.A. Escobar, W.Q. Meeker Jr, "Planning accelerated life tests with two or more experimental factors", Technometrics, vol 37, 1995 Nov, pp 411 - 427.
5. J.F. Lawless, Statistical Models and Methods for Lifetime Data, 1982; John Wiley & Sons.
6. W.Q. Meeker Jr, "A comparison of accelerated life test plans for Weibull and lognormal distributions and type1 censoring", Technometrics, vol 26, 1984 May, pp 157 171.
7. W.Q. Meeker Jr, L.A. Escobar, "Review of recent research in accelerated testing", Int'l Statistical Review, vol 61, 1993, pp 147- 168.
8. W.Q. Meeker Jr, G.J. Hahn, :'How to plan an accelerated life test", ASQ Basic References in Quality Control: Statistical Techniques, vol 10; ASQ.
9. C.A. Meeter, W.Q. Meeker Jr, "Optimum accelerated life tests with nonconstant er", Technometrics, vol 36, 1994 Feb, pp 71 - 83.
10. W. Nelson, Accelerated Testing, 1990; John Wiley & Sons.
11. W. Nelson, Bibliography on accelerated test plans, 1993 (available from Dr. Nelson upon request).
12. W. Nelson, T.J. Kielpinski, "Theory for optimum censored accelerated life tests for normal and lognormal life distributions", Technometrics, .vol 18, 1976 Feb, pp 105 - 114.
13. W. Nelson, W.Q. Meeker Jr, "Theory for optimum accelerated life tests for Weibull and extreme value distributions", Technometrics, vol 20, 1978 May, pp 171 - 177.
14. R.R. Sitter, "Robust designs for binary data", Biometrics, vol 48, 1992 Dec, pp 1145 - 1155.
15. R.R. Sitter, C.F.J. Wu, "Two-stage design of quantal response studies". Tech. Report 2-47, 1995; Dep't of Statistics, Univ. of Michigan, Ann Arbor.