Theory for optimum accelerated censored life tests for weibull and extreme value distributions

Technometrics

Volumn 20, Issue 2, 1978, Pages 171-177

  Meeker, William Q ^b  

^a GENERAL ELECTRIC COMPANY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

Accelerated testing; Life data analysis; Optimum test plans; Smallest extreme value distribution; Weibull distribution

Indexed keywords

STATISTICAL METHODS;

MATERIALS TESTING;

EID: 0017972683     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1978.10489643     Document Type: Article

References (13)

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