Planning accelerated life tests with two or more experimental factors

Technometrics

Volumn 37, Issue 4, 1995, Pages 411-427

  Escobar, Luis A ^a   Meeker, William Q ^b  

^a LOUISIANA STATE UNIVERSITY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

c optimality; D optimality; Design of experiments; Life data; Lognormal distribution; Reliability; Test planning; Weibull distribution

Indexed keywords

EID: 0242389859     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1995.10484374     Document Type: Article

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