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Volumn 7, Issue 8, 1998, Pages 1155-1162

Improved high-temperature stability of Si incorporated a-C:H films

Author keywords

a C:H films; High temperature stability; Silicon

Indexed keywords

AMORPHOUS FILMS; CARBON; ELECTRON SPIN RESONANCE SPECTROSCOPY; GRAPHITIZATION; SILICON; THERMODYNAMIC STABILITY;

EID: 0032140329     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(98)00165-4     Document Type: Article
Times cited : (86)

References (20)
  • 2
    • 84909782928 scopus 로고
    • R. Messier, J.T. Glass, J.E. Butler, J.T. Glass (Eds.), Materials Research Society, Pittsburgh, PA
    • J.C. Angus, Y. Wang, R.W. Hofman, in: R. Messier, J.T. Glass, J.E. Butler, J.T. Glass (Eds.), New Diamond Science and Technology, Materials Research Society, Pittsburgh, PA, 1991, p. 11.
    • (1991) New Diamond Science and Technology , pp. 11
    • Angus, J.C.1    Wang, Y.2    Hofman, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.