In situ monitoring of kinetics of charged thiol adsorption on gold using an atomic force microscope

Langmuir

Volumn 14, Issue 17, 1998, Pages 4790-4794

  Hu, Kai ^a   Bard, Allen J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; GOLD; INTERFACES (MATERIALS); RATE CONSTANTS; SOLUTIONS; SURFACE PHENOMENA;

LANGMUIR RATE LAW;

SULFUR COMPOUNDS;

EID: 0032138368     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la971363o     Document Type: Article

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