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Volumn 66, Issue 7, 1995, Pages 3789-3798

Method for the calibration of atomic force microscope cantilevers

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[No Author keywords available]

Indexed keywords


EID: 36449002856     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1145439     Document Type: Article
Times cited : (834)

References (34)
  • 13
    • 84950574593 scopus 로고    scopus 로고
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