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Volumn 66, Issue 7, 1995, Pages 3789-3798
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Method for the calibration of atomic force microscope cantilevers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36449002856
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1145439 Document Type: Article |
Times cited : (834)
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References (34)
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