Imaging nanometer-thick patterned self-assembled monolayers via second-harmonic generation microscopy

Journal of Applied Physics

Volumn 81, Issue 5, 1997, Pages 2051-2054

  Smilowitz, L ^a   Jia, Q X ^a   Yang, X ^a   Li, D Q ^a   McBranch, D ^a   Buelow, S J ^a   Robinson, J M ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001627792     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364284     Document Type: Article

References (12)

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