SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 284-285, Issue , 1996, Pages 412-416

Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports

(3) Harke, Michael a Stelzle, Martin a Motschmann, Hubert R a

a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES (Germany)

Author keywords

Ellipsometric imaging; Monolayers; Oil water interface; Orientational order

Indexed keywords

IMAGING TECHNIQUES; LIQUID CRYSTALS; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; MOLECULAR ORIENTATION; MONOLAYERS; OPTICAL RESOLVING POWER; PHASE INTERFACES;

AIR WATER INTERFACE; IMAGING NULLELLIPSOMETRY; JONES MATRIX; OIL WATER INTERFACE;

ELLIPSOMETRY;

EID: 0030235450 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(95)08354-5 Document Type: Article

Times cited : (24)

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