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Volumn 11, Issue 3, 1998, Pages 486-494

Virtual plasma equipment model: A tool for investigating feedback control in plasma processing equipment

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED MANUFACTURING; COMPUTER SIMULATION; FEEDBACK CONTROL; MICROELECTRONIC PROCESSING; PLASMA APPLICATIONS;

EID: 0032136286     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.705383     Document Type: Article
Times cited : (14)

References (21)
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  • 8
    • 21844516463 scopus 로고
    • Simulation of real-time control of two-dimensional features in inductively coupled plasma sources for etching applications
    • P. L. G. Ventzek, N. Yamada, Y. Sakai, H. Tagashira, and K. Kitamori, "Simulation of real-time control of two-dimensional features in inductively coupled plasma sources for etching applications," J. Vac. Sci. Technol. A, vol. 13, pp. 2456-2463, 1995.
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  • 10
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    • Run by run uniformity control on a dual coil transformer coupled plasma reactor with full wafer interferometry
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    • (1996) Abstr. 43rd Nat. Symp. Amer. Vacuum Soc. , pp. 29
    • Le, M.S.1    Boning, D.S.2    Sawin, H.H.3
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    • Ion drag effects in inductively coupled plasmas for etching
    • W. Z. Collison and M. J. Kushner, "Ion drag effects in inductively coupled plasmas for etching," Appl. Phys. Lett., vol. 68, pp. 903-905, 1996.
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 903-905
    • Collison, W.Z.1    Kushner, M.J.2
  • 12
    • 0000466584 scopus 로고    scopus 로고
    • A semi-analytic sheath model integrated into a 2-dimensional model for radio frequency biased, inductively coupled plasma etching reactors
    • M. J. Grapperhaus and M. J. Kushner, "A semi-analytic sheath model integrated into a 2-dimensional model for radio frequency biased, inductively coupled plasma etching reactors," J. Appl. Phys., vol. 81, pp. 569-577, 1997.
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    • Grapperhaus, M.J.1    Kushner, M.J.2
  • 13
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    • Investigation of electron source and ion flux uniformity in high plasma density inductively coupled etching tools using two-dimensional modeling
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    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3118-3137
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.