Micro X-Ray Small-Angle Scattering with Synchrotron Radiation1

Journal of Macromolecular Science - Physics

Volumn 37, Issue 4, 1998, Pages 587-599

  Riekel, C ^a   Engstrom P ^b   Martin, C ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c KEELE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; FOCUSING; MIRRORS; MONOCHROMATORS; OPTICAL COLLIMATORS; OPTICAL INSTRUMENT LENSES; PLASTIC FILAMENTS; POLYETHYLENE TEREPHTHALATES; SILICONES; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY;

SMALL ANGLE X RAY SCATTERING (SAXS);

X RAY CAMERAS;

EID: 0032119595     PISSN: 00222348     EISSN: None     Source Type: Journal    
DOI: 10.1080/00222349808220494     Document Type: Article

References (40)

1. E. Baer, A. Hiltner, and H. D. Keith, Science, 235, 1015 (1987).
2. G. Elsner, C. Riekel, and H. G. Zachmann, in Advances in Polymer Science, Vol. 67 (H. H. Kausch and H. G. Zachmann, Eds.), Berlin, Springer, 1985, pp. 1-57.
3. G. Rosenbaum and K. C. Holmes, in Synchrotron Radiation Research, (S. D. H. Winick, Ed.), New York, Plenum Press, 1980, pp. 533-564.
4. J. Hendrix, M. Koch, and M. H. J. Bordas, J. Appl. Cryst., 12, 467 (1979).
5. S. Dreher, H. G. Zachmann, C. Riekel, and P. Engström, Macromolecules, 28, 7071 (1995).
6. A. Mahendrasingam, C. Martin, W. Fuller, D. J. Blundell, D. MacKerron, R. J. Rule, R. J. Oldman, J. Liggat, C. Riekel, and P. Engström, J. Synchr. Rad., 2, 308 (1995).
7. C. Riekel, A. Cedola, F. Heidelbach, and K. Wagner, Macromolecules, 30, 1033 (1997).
8. L. C. Sawyer and D. T. Grubb, Polymer Microscopy, Chapman and Hall, London, 1996.
9. A. Iida and K. Hirano, NIM, B114, 149 (1996).
10. A. C. Thompson and K. Chapman, in Mater. Res. Soc., Symp. Proc., Vol. 437 (L. J. Terminelle, S. M. Mini, H. Ade, and D. L. Perry, Eds.), Materials Research Society, Pittsburgh, PA, 1996, pp. 113-118.
11. D. H. Bilderback, S. A. Hoffman, and D. J. Thiel, Science, 263, 201 (1994).
12. P. Engström, S. Larsson, A. Rindby, A. Buttkewitz, S. Garbe, G. Gaul, A. Knochel, and F. Lechtenberg, NIM, A302, 547 (1991).
13. Y. Suzuki, N. Kamijo, S. Tamura, S. Handa, A. Takeuchi, S. Yamamoto, S. Sugiyama, K. Ohsumi, and M. Ando, J. Synchr. Rad., 4, 60 (1997).
14. S. M. Kuznetsov, I. I. Snigireva, A. A. Snigirev, P. Engström, and C. Riekel, Appl. Phys. Lett., 65, 827 (1994).
15. Y. P. Feng, S. K. Sinha, H. W. Deckman, J. B. Hastings, and D. P. Siddons, Appl. Phys. Lett., 67, 3647 (1995).
16. W. Jark, S. DiFonzo, S. Lagomarsino, A. Cedola, E. D. Fabrizio, A. Bram, and C. Riekel, J. Appl. Phys., 80, 4831 (1996).
17. I. M. Watt, The Principles and Practice of Electron Microscopy, Cambridge University Press, Cambridge, England, 1997.
18. C. Riekel, P. Boesecke, O. Diat, and P. Engström, J. Molec. Struct., 383, 291 (1996).
19. C. Riekel, P. Bosecke, and M. S. D. Rio, Rev. Sci. Instr., 63, 974 (1992).
20. P. Engström, S. Fiedler, and C. Riekel, Rev. Sci. Instr., 66, 1348 (1995).
21. C. Riekel, P. Bosecke, O. Diat, M. Lorenzen, and M. S. D. Rio, Rev. Sci. Instr., 66, 987 (1994).
22. C. Riekel and P. Engström, NIM, B97, 224 (1995).
23. C. Schulze, U. Lienert, M. Hanfland, M. Lorenzen, and F. Zontone, J. Synchr. Rad., 5, 77-81 (1998).
24. P. Deschamps, P. Engström, S. Fiedler, C. Riekel, S. Wakatsuki, P. Høghøj, and E. Ziegler, J. Synchr. Rad., 2, 124 (1995).
25. M. Grosse, A. Hempel, J. Boehmert, F. Eichhorn, C. Riekel, and P. Engström, J. Molec. Struct., 383, 267 (1996).
26. A. A. Snigirev, I. I. Snigireva, C. Riekel, A. Miller, L. Wess, and T. Wess, J. Phys., 3, 443 (1994).
27. A. Souvorov, A. Snigirev, I. Snigireva, and E. Aristova, Rev. Sci. Instr., 67, 1733 (1996).
28. P. Chevallier, P. Dhez, F. Legrand, M. Idir, G. Soullie, A. Mirone, A. Erko, A. Snigirev, I. Snigireva, A. Suvorov, A. Freund, P. Engström, J. Als-Nielsen, and G. Grubel, NIM, A354, 584 (1994).
29. P. Engström and C. Riekel, Rev. Sci. Instr., 67, 4061 (1996).
30. A. Buleon, B. Pontoire, C. Riekel, H. Chanzy, W. Helbert, and R. Vuong, Macromolecules, 30, 3952 (1997).
31. T. A. Waigh, I. Hopkinson, A. M. Donald, M. Butler, F. Heidelbach, and C. Riekel, Macromolecules, 30, 3813 (1997).
32. P. Engstrom and C. Riekel, J. Synchr. Rad., 3, 97 (1996).
33. T. C. Huang, H. Toraya, T. N. Blanton, and Y. Wu, J. Appl. Cryst., 26, 180 (1993).
34. S. S. Pollack and J. H. Magill, J. Polym. Sci., A-2, 551 (1969).
35. J. H. Magill, J. Polym. Sci., 7, 1187 (1969).
36. D. C. Prevorsek, Y. D. Kwon, and R. K. Sharma, J. Mater. Sci., 12, 2310 (1977).
37. B. Catorie, R. Hagege, and D. Meimoun, Bull. Inst. Text. Fr., 23, 521 (1969).
38. O. Glatter, in Small Angle Scattering (O. Glatter and O. Kratky, Eds.), Academic Press, New York, 1982, p. 119.
39. C. Riekel, in Synchrotron Radiation in Chemistry and Biology III, Vol. 151 (E. Mandelkow, Ed.), Springer-Verlag, Berlin, 1989, pp. 205-229.
40. H. Tusruta, S. Brennan, Z. U. Rek, W. H. Tompkins, and K. O. Hodgson, J. Appl. Cryst., in press.