Ion implanted Bragg-Fresnel lens

Review of Scientific Instruments

Volumn 67, Issue 5, 1996, Pages 1733-1736

  Souvorov, A ^a   Snigirev, A ^a   Snigireva, I ^a   Aristova, E ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013096794     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146985     Document Type: Article

References (6)

1. E. Aristova, C. David, A. Freund, Ya. Hartman, B. Kaulich, A. Snigirev, and V. Yunkin, Proceedings of the 4th International Conference on X-Ray Microscopy, X-Ray Microsc. IV (to be published).
2. V. V. Aristov, Yu. A. Basov, T. E. Goureev, A. A. Snigirev, T. Ishikawa, K. Izumi, and S. Kikuta, Jpn. J. Appl. Phys. 31, 2616 (1992).
3. A. A. Snigirev and A. Yu. Suvorov, Acta Crystallogr. Sect. A 49, 818 (1993).
4. Ya. Hartman, I. Snigireva, A. Snigirev, P. Engström, and C. Riekel, Acta Crystallogr. Sect. A 49 (Suppl.), 375 (1993).
5. Ya. Hartman, A. Freund, I. Snigireva, and A. Snigirev, Nucl. Instrum. Methods (to be published).
6. V. G. Kohn, M. V. Kovalchuk, R. M. Imamov, and E. F. Lobanovich, Phys. Status Solidi A 64, 435 (1981).