Cantilever flexure, adhesive/attractive and lateral force measurements on highly-oriented pyrolytic graphite by scanning force microscopy

Vacuum

Volumn 50, Issue 3-4, 1998, Pages 281-287

  Mechler, A ^a   Heszler, P ^b   Reimann, C T ^c   Revesz K ^d   Bor, Z ^a  

^a UNIVERSITY OF SZEGED   (Hungary)

^b RESEARCH GROUP ON LASER PHYSICS   (Hungary)

^c UPPSALA UNIVERSITY   (Sweden)

^d INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; ETCHING; FRICTION; HIGH TEMPERATURE EFFECTS; ION BOMBARDMENT; SCANNING ELECTRON MICROSCOPY;

CANTILEVER FLEXURE; HIGHLY ORIENTED PYROLYTIC GRAPHITE; LATERAL FORCE MEASUREMENT; SCANNING FORCE MICROSCOPY;

GRAPHITE;

EID: 0032108831     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00054-2     Document Type: Article

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