Defect pinning in monolayer films by highly controlled graphite defects: Molecule corrals

Langmuir

Volumn 12, Issue 7, 1996, Pages 1830-1835

  Patrick, David L ^a   Cee, Victor J ^a   Purcell, Timothy J ^a   Beebe Jr , Thomas P ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; GRAIN BOUNDARIES; GRAPHITE; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; MONOLAYERS; SCANNING TUNNELING MICROSCOPY;

DEFECT PINNING; MOLECULE CORRALS;

THIN FILMS;

EID: 0030567278     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la950354h     Document Type: Article

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16. The mean is defined as the average position of the grain boundary during the last few seconds.
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