Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuum

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1296-1301

  Muller T ^a   Kasser T ^a   Labardi, M ^a,b   Lux Steiner, M ^a   Marti, O ^a,c   Mlynek, J ^a   Krausch, G ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b UNIVERSITY OF PISA   (Italy)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243238577     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589084     Document Type: Article

References (24)

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