The Complementary Nature of X-Ray Photoelectron Spectroscopy and Angle-Resolved X-Ray Diffraction Part I: Background and Theory

Journal of Materials Engineering and Performance

Volumn 7, Issue 3, 1998, Pages 329-333

  Kerber, S J ^a   Barr, T L ^b   Mann, G P ^b   Brantley, W A ^c   Papazoglou, E ^c   Mitchell, J C ^c  

^a Material Interface Inc   (United States)

^b University of Wisconsin Milwaukee   (United States)

^c OHIO STATE UNIVERSITY   (United States)

Author keywords

Angle resolved; Depth profile; Oxide; Review; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

OXIDES; X RAY DIFFRACTION ANALYSIS;

ANGLE RESOLVED X RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032096893     PISSN: 10599495     EISSN: None     Source Type: Journal    
DOI: 10.1361/105994998770347765     Document Type: Article

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