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Volumn 15, Issue 3, 1997, Pages 470-477
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Growth and characterization of aluminum oxide thin films for evaluation as reference materials
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000345439
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.580876 Document Type: Article |
Times cited : (11)
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References (15)
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