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Volumn 15, Issue 3, 1997, Pages 470-477

Growth and characterization of aluminum oxide thin films for evaluation as reference materials

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000345439     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580876     Document Type: Article
Times cited : (11)

References (15)
  • 3
    • 0004077698 scopus 로고
    • 02.05 on Metallic and Inorganic Coatings, ASTM, Philadelphia
    • ASTM, 1990 Annual Book of ASTM Standards, Vol. 02.05 on Metallic and Inorganic Coatings, (ASTM, Philadelphia, 1990).
    • (1990) 1990 Annual Book of ASTM Standards
  • 8
    • 0042452079 scopus 로고
    • edited by D. E. Newbury San Francisco Press, San Francisco
    • R. A. Waldo, in Microbeam Analysis - 1988, edited by D. E. Newbury (San Francisco Press, San Francisco, 1988), pp. 310-314.
    • (1988) Microbeam Analysis - 1988 , pp. 310-314
    • Waldo, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.