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Volumn 145, Issue 6, 1998, Pages 2198-2204

Present and future role of chemical mechanical polishing in wafer bonding

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; MORPHOLOGY; SUBSTRATES; THIN FILMS;

EID: 0032094951     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838616     Document Type: Article
Times cited : (16)

References (49)
  • 29
    • 0041783900 scopus 로고
    • Direct Bonding
    • Elsevier, Amsterdam
    • Special Issue on Direct Bonding, Philips J. Res., 49, No. 1-2, Elsevier, Amsterdam (1995).
    • (1995) Philips J. Res. , vol.49 , Issue.1-2 SPEC. ISSUE
  • 39
    • 11644301937 scopus 로고    scopus 로고
    • Private communications
    • M. Bergh, Private communications.
    • Bergh, M.1
  • 43
    • 11644270257 scopus 로고    scopus 로고
    • Barcelona, IEEE Robotics and Automation Society and ASME Dynamic Systems and Control Division
    • S. Sánchez, C. Gui, and M. Elwenspoek, in Proceedings of MME 96, p. 16, Barcelona, IEEE Robotics and Automation Society and ASME Dynamic Systems and Control Division (1996).
    • (1996) Proceedings of MME 96 , pp. 16
    • Sánchez, S.1    Gui, C.2    Elwenspoek, M.3
  • 46
    • 11644309083 scopus 로고    scopus 로고
    • Heldelberg, IEEE Electron Devices Society and ASME Dynamic Systems and Control Division
    • J. Kränert, C. Deter, T. Gessner, and W. Dötzel, in Proceedings of MEMS '98, p. 99, Heldelberg, IEEE Electron Devices Society and ASME Dynamic Systems and Control Division (1998).
    • (1998) Proceedings of MEMS '98 , pp. 99
    • Kränert, J.1    Deter, C.2    Gessner, T.3    Dötzel, W.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.