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Volumn 38, Issue 1, 1997, Pages 382-383

Failure modes in organic light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; FAILURE (MECHANICAL); LEAKAGE CURRENTS; LIGHT EMISSION; QUANTUM EFFICIENCY; STRESSES; SUBSTRATES; VACUUM APPLICATIONS; VAPOR DEPOSITION;

EID: 0031122177     PISSN: 00323934     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (19)

References (13)
  • 10
    • 3242874215 scopus 로고    scopus 로고
    • In US patent 5,256,945; Pioneer Electronic Corp.:, 1993
    • Imai, K.; Shinkai, M.; Wakimoto, T.; Shirota, Y. In US patent 5,256,945; Pioneer Electronic Corp.:, 1993.
    • Imai, K.1    Shinkai, M.2    Wakimoto, T.3    Shirota, Y.4
  • 12
    • 0000688036 scopus 로고    scopus 로고
    • Digest of Technical Papers, San Diego
    • Tang, C. W. 1996 SID Int. Symp., Digest of Technical Papers, San Diego, 1996; p 181.
    • (1996) 1996 SID Int. Symp. , pp. 181
    • Tang, C.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.