Technique for an accurate estimation of the mean square electric field in ATR FT-IR spectroscopy

Applied Spectroscopy

Volumn 52, Issue 5, 1998, Pages 773-776

  Ekgasit, Sanong ^a  

^a THAILAND INSTITUTE OF SCIENTIFIC AND TECHNOLOGICAL RESEARCH   (Thailand)

Author keywords

ATR FT IR spectroscopy; Evanescent field; Kramers Kronig analysis; Mean square electric field; Phase change upon reflection

Indexed keywords

COMPUTATIONAL METHODS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; LIGHT EXTINCTION; LIGHT REFLECTION; REFRACTIVE INDEX;

ATTENUATED TOTAL REFLECTION (ATR); EXTINCTION COEFFICIENTS; MEAN SQUARE ELECTRIC FIELD (MSEF); MEAN SQUARE EVANESCENT FIELD;

ELECTRIC FIELDS;

EID: 0032069780     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702981944229     Document Type: Article

References (17)

1. N. J. Harrick, J. Opt. Soc. Am. 55, 85 (1965).
2. W. N. Hansen. Spectrochim. Acta 21, 815 (1965).
3. P. A. Flournoy and W. J. Schaffers, Spectrochim. Acta 22, 5 (1966).
4. W. N. Hansen, in Advances in Electrochemistry and Electrochemical Engineering, R. H. Muller, Ed. (John Wiley, New York, 1973), Vol. 9.
5. H. G. Tompkins, Appl. Spectrosc. 28, 335 (1974).
6. T. Hirschfeld, Appl. Spectrosc. 31, 289 (1977).
7. N. J. Harrick, Internal Reflection Spectroscopy (Harrick Scientific Corporation, Ossining, New York, 1987).
8. L. J. Fina, Appl. Spectrosc. Rev. 29, 309 (1994).
9. F. M. Mirabella, Jr., Appl. Spectrosc. Rev. 21, 45 (1985).
10. S. Ekgasit and H. W. Siesler, Appl. Spectrosc. 52, xxx (1998).
11. W. N. Hansen, J. Opt. Soc. Am. 58, 380 (1968).
12. S. Ekgasit and H. Ishida, Appl. Spectrosc. 50, 1187 (1996).
13. S. Ekgasit and H. Ishida, Vib. Spectrosc. 13, 1 (1997).
14. S. Ekgasit and H. Ishida, Appl. Spectrosc. 51, 461 (1997).
15. K. Yamamoto, A. Masui, and H. Ishida, Appl. Opt. 33, 6285 (1994).
16. K. Yamamoto and H. Ishida, Spectrochim. Acta 50A, 2079 (1966).
17. K. Yamamoto and A. Masui, Appl. Spectrosc. 49, 639 (1995).