Optical depth profiling by attenuated total reflection Fourier transform infrared spectroscopy using an incident beam with arbitrary degree of polarization

Vibrational Spectroscopy

Volumn 13, Issue 1, 1996, Pages 1-9

  Ekgasit, Sanong ^a   Ishida, Hatsuo ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

ATR FTIR; Depth profiling; Linear least square fitting; Multiple angle ATR FTIR spectroscopy; Nonlinear fitting

Indexed keywords

ATTENUATION; ELECTRIC FIELDS; ESTIMATION; LIGHT POLARIZATION; LIGHT REFLECTION; REFRACTIVE INDEX; WHITE NOISE;

ATTENUATED TOTAL REFLECTION FOURIER TRANSFORM INFRARED SPECTROSCOPY; DEPTH PROFILING; INCIDENT BEAM; LINEAR LEAST SQUARE FITTING; NONLINEAR FITTING;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0030401765     PISSN: 09242031     EISSN: None     Source Type: Journal    
DOI: 10.1016/0924-2031(96)00028-8     Document Type: Article

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