Application of a new quantitative optical depth profiling technique for the diffusion of polymers

Applied Spectroscopy

Volumn 51, Issue 4, 1997, Pages 461-465

  Ekgasit, Sanong ^a   Ishida, Hatsuo ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

Attenuated total reflection Fourier transform infrared spectroscopy; Depth profiling; Interdiffusion; Laminated film

Indexed keywords

AMORPHOUS MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; LIGHT POLARIZATION; PLASTIC FILMS; PLASTIC LAMINATES; POLYETHERS; POLYSTYRENES;

ATTENUATED TOTAL REFLECTION SPECTROSCOPY; POLYVINYL METHYL ETHERS;

INTERDIFFUSION (SOLIDS);

EID: 0031117795     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971940594     Document Type: Article

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